Imaging of Ti 0.87 O 2 nanosheets using scanning tunneling spectroscopy

Applied Surface Science

Volumn 265, Issue , 2013, Pages 201-204

  Kumar, Avijit ^a   Palanisamy, Suresh Kumar C ^a   Boter, Jelmer M ^a   Hellenthal, Chris ^a   Ten Elshof, Johan E ^a   Zandvliet, Harold J W ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Scanning tunneling microscopy; Scanning tunneling spectroscopy

Indexed keywords

ENERGY GAP; HIGH FREQUENCY AMPLIFIERS; NANOSHEETS; PLATINUM COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY; TITANIUM COMPOUNDS;

HIGH FREQUENCY HF; LOCK-IN AMPLIFIER; SCANNING TUNNELING SPECTROSCOPY; SINGLE LAYER; STM IMAGES;

SCANNING TUNNELING MICROSCOPY;

EID: 84871936000     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.10.169     Document Type: Article

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