Spatial mapping of the inverse decay length using scanning tunneling microscopy

Applied Physics Letters

Volumn 92, Issue 17, 2008, Pages

  De Vries, R J ^a   Saedi, A ^a   Kockmann, D ^a   Van Houselt, A ^a   Poelsema, B ^a   Zandvliet, H J W ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; ELECTRONIC STRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS;

MOLECULES AT SURFACES; SPATIAL MAPPING; SPECTROSCOPIC TECHNIQUES; TUNNELING CURRENT;

DECAY (ORGANIC);

EID: 43049108013     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2917716     Document Type: Article

References (13)

1. G. Binnig, K. H. Frank, H. Fuchs, N. Garcia, B. Reihl, H. Rohrer, F. Salvan, and A. R. Williams, Phys. Rev. Lett. 55, 991 (1985).
2. G. Binnig and H. Rohrer, Surf. Sci. 157, L373 (1985).
3. B. C. Stipe, M. A. Rezaei, and W. Ho, Science 280, 1732 (1998).
4. J. A. Stroscio, R. M. Feenstra, and A. P. Fein, Phys. Rev. Lett. 57, 2579 (1986).
5. R. M. Feenstra, J. A. Stroscio, and A. P. Fein, Surf. Sci. 181, 295 (1987).
6. O. Gurlu, O. A. O. Adam, H. J. W. Zandvliet, and B. Poelsema, Appl. Phys. Lett. 83, 4610 (2003).
7. N. Oncel, A. van Houselt, J. Huijben, A.-S. Hallbäck, O. Gurlu, H. J. W. Zandvliet, and B. Poelsema, Phys. Rev. Lett. 95, 116801 (2005).
8. M. Fischer, A. van Houselt, D. Kockmann, B. Poelsema, and H. J. W. Zandvliet, Phys. Rev. B 76, 245429 (2007).
9. J. G. Simmons, J. Appl. Phys. 34, 1793 (1963).
10. J. G. Simmons, J. Appl. Phys. 34, 2581 (1963).
11. D. I. Gittins, D. Bethell, D. J. Schiffrin, and R. J. Nichols, Nature (London) 408, 67 (2000).
12. J. Tersoff and D. R. Hamann, Phys. Rev. Lett. 50, 1998 (1983).
13. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).