SCOPUS 정보 검색 플랫폼

Volumn 620, Issue , 2013, Pages 213-218

X-ray and morphological characterization of Al-O thin films used for vertically aligned single-walled carbon nanotube growth

(5) Azam, Mohd Asyadi a,b Rashid, Mohd Warikh Abd a Isomura, Kazuki b Fujiwara, Akihiko c Shimoda, Tatsuya b

a UNIVERSITI TEKNIKAL MALAYSIA MELAKA (Malaysia)

b JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

Author keywords

Alcohol catalytic CVD; Aluminum oxide support layer; Cobalt catalyst; Vertically aligned single walled carbon nanotube; XPS; XRD

Indexed keywords

CATALYTIC CVD; COBALT CATALYST; SUPPORT LAYER; VERTICALLY ALIGNED; XRD;

CATALYSTS; INDUSTRIAL RESEARCH; OXIDE FILMS; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM;

EID: 84871886127 PISSN: 10226680 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/AMR.620.213 Document Type: Conference Paper

Times cited : (15)

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