Phase evolution and microwave dielectric properties of (Li 0.5Bi0.5)(W1-xMox)O4 (0.0 ≤ x ≤ 1.0) ceramics with ultra-low sintering temperatures

Functional Materials Letters

Volumn 5, Issue 4, 2012, Pages

  Zhou, Di ^a   Guo, Jing ^a   Yao, Xi ^a   Pang, Li Xia ^b   Qi, Ze Ming ^c   Shao, Tao ^c  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b XI'AN TECHNOLOGICAL UNIVERSITY   (China)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

low temperature co fired ceramic; Microwave dielectric ceramic; scheelite; wolframite

Indexed keywords

DIELECTRIC SPECTRA; ENERGY DISPERSIVE X-RAY; INFRARED SPECTRUM; LOW TEMPERATURE CO-FIRED CERAMICS; LOW-TEMPERATURE CO-FIRED CERAMIC TECHNOLOGIES; MICROWAVE DIELECTRIC CERAMICS; MICROWAVE DIELECTRIC PROPERTIES; PHASE EVOLUTIONS; RELATIVE PERMITTIVITY; SCHEELITE; SINTERING TEMPERATURES; SOLID STATE REACTION METHOD; TEMPERATURE COEFFICIENT; WOLFRAMITE;

CERAMIC MATERIALS; MICROELECTRONICS; SCANNING ELECTRON MICROSCOPY; SOLID STATE REACTIONS; TUNGSTATE MINERALS; X RAY DIFFRACTION ANALYSIS;

SINTERING;

EID: 84871793338     PISSN: 17936047     EISSN: 17937213     Source Type: Journal    
DOI: 10.1142/S1793604712500427     Document Type: Article

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