Investigation of the relations between structure and microwave dielectric properties of divalent metal tungstate compounds

Journal of the European Ceramic Society

Volumn 26, Issue 10-11, 2006, Pages 2051-2054

  Yoon, Sung Hun ^a   Kim, Dong Wan ^a   Cho, Seo Yong ^a,b   Hong, Kug Sun ^a  

^a Seoul National University   (South Korea)

^b Cerectron Co Ltd   (South Korea)

Author keywords

Dielectric properties; Microwave processing; Sintering; Substrates; Tungstate

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; PERMITTIVITY; POSITIVE IONS; SINTERING; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

DIVALENT METAL; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE PROCESSING;

TUNGSTEN COMPOUNDS;

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; PERMITTIVITY; POSITIVE IONS; SINTERING; SUBSTRATES; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 33645541535     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.09.058     Document Type: Conference Paper

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