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Volumn 21, Issue 45, 2011, Pages 18412-18420

Phase transition, Raman spectra, infrared spectra, band gap and microwave dielectric properties of low temperature firing (Na0.5xBi 1-0.5x)(MoxV1-x)O4 solid solution ceramics with scheelite structures

(6) Zhou, Di a Pang, Li Xia b Wang, Hong a Guo, Jing a Yao, Xi a Randall, Clive A c

a XI'AN JIAOTONG UNIVERSITY (China)

b XI'AN TECHNOLOGICAL UNIVERSITY (China)

c PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP ENERGY; DIELECTRIC PERMITTIVITIES; IN-SITU; INFRARED SPECTRUM; LOW TEMPERATURE CO-FIRED CERAMICS TECHNOLOGIES; LOW-TEMPERATURE FIRING; MICROWAVE DIELECTRIC PROPERTIES; MONOCLINIC PHASE; RAMAN STUDIES; ROOM TEMPERATURE; SCHEELITE STRUCTURE; SOLID SOLUTION CERAMICS; SOLID STATE REACTION METHOD; STRUCTURAL PHASE TRANSITION; STRUCTURAL TRANSITIONS; TEMPERATURE COEFFICIENT; TEMPERATURE RANGE; TEMPERATURE STABLE; VARIABLE TEMPERATURE; VISIBLE LIGHT REGION; VISIBLE-LIGHT IRRADIATION;

CERAMIC MATERIALS; DIELECTRIC DEVICES; ENERGY GAP; ION SENSITIVE FIELD EFFECT TRANSISTORS; MICROWAVE DEVICES; PERMITTIVITY; RAMAN SPECTROSCOPY; SINTERING; SODIUM; SOLID STATE REACTIONS; SOLIDIFICATION; STRUCTURAL CERAMICS; TUNGSTATE MINERALS;

SOLID SOLUTIONS;

EID: 80755125474 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c1jm14004c Document Type: Article

Times cited : (95)

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