Thickness-dependent polarization of strained BiFeO3 films with constant tetragonality

Physical Review Letters

Volumn 109, Issue 26, 2012, Pages

  Rault, J E ^a   Ren, W ^b,c   Prosandeev, S ^b   Lisenkov, S ^d   Sando, D ^e,f   Fusil, S ^e,f,g   Bibes, M ^e,f   Barthelemy A ^e,f   Bellaiche, L ^b   Barrett, N ^a  

^a DIF   (France)

^b UNIVERSITY OF ARKANSAS   (United States)

^c SHANGHAI UNIVERSITY   (China)

^d UNIVERSITY OF SOUTH FLORIDA   (United States)

^e ECOLE POLYTECHNIQUE   (France)

^f UNIVERSITÉ PARIS SACLAY   (France)

^g UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS MEDIUM; CRITICAL THICKNESS; DEPOLARIZING FIELDS; EFFECTIVE HAMILTONIAN; ELECTRICAL BOUNDARY CONDITIONS; FERROELECTRIC POLARIZATION; LOW ENERGY ELECTRONS; NANO SCALE; OPEN CIRCUITS; OUT-OF-PLANE; PHOTOELECTRON EMISSION MICROSCOPY; POLARIZATION DECAY; POLARIZATION STATE; STRIPE DOMAIN; TETRAGONAL DISTORTION; TETRAGONALITY;

CALCULATIONS; ELECTRON MICROSCOPY; FERROELECTRIC FILMS; ULTRATHIN FILMS;

POLARIZATION;

EID: 84871788057     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.267601     Document Type: Article

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