Imaging ferroelectric domains in multiferroics using a low-energy electron microscope in the mirror operation mode

Physica Status Solidi - Rapid Research Letters

Volumn 4, Issue 1-2, 2010, Pages 22-24

  Cherifi, Salia ^a,b   Hertel, Riccardo ^c   Fusil, Stéphane ^d,e   Béa, Hélène ^f   Bouzehouane, Karim ^d   Allibe, Julie ^d   Bibes, Manuel ^d   Barthélémy, Agnès ^d  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d UNITÉ MIXTE DE PHYSIQUE CNRS THALES   (France)

^e UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

^f UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; MIRRORS; SCANNING PROBE MICROSCOPY; SENSITIVITY ANALYSIS;

FERROELECTRIC DOMAINS; FULL-FIELD IMAGING; LOW ENERGY ELECTRON MICROSCOPES; LOW ENERGY ELECTRON MICROSCOPY; PIEZORESPONSE FORCE MICROSCOPY; POLARIZED FERROELECTRIC DOMAINS; SMALL VARIATIONS; SUB-MICRON RESOLUTIONS;

FERROELECTRICITY;

EID: 76549128462     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200903297     Document Type: Article

References (18)

1. N. A. Spaldin and M. Fiebig, Science 309, 391 (2005).
2. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 65, 125408 (2002).
3. Y.-H. Chu et al., Nature Mater. 7, 478 (2008).
4. T. Zhao et al., Nature Mater. 5, 823 (2006).
5. L. Mayer, J. Appl. Phys. 26, 1228 (1955).
6. E. Bauer, Rep. Prog. Phys. 57, 895 (1994).
7. E. Bauer, Surf. Rev. Lett. 5, 1275 (1998).
8. G. V. Spivak et al., Sov. Phys. Crystallogr. 4, 115 (1959).
9. K. N. Maffitt, J. Appl. Phys. 39, 3878 (1968).
10. F. L. English, J. Appl. Phys. 39, 128 (1968).
11. Le Bihan et al., Ferroelectrics 13, 475 (1976).
12. Th. Schmidt et al., Surf. Rev. Lett. 5, 1287 (1998).
13. H. Béa et al., Appl. Phys. Lett. 87, 072508 (2005).
14. S. A. Nepijko et al., J. Microsc. 203, 269 (2001).
15. S. A. Nepijko and G. Schönhense, J. Microsc., DOI: 10.1111/j.1365-2818.2009.03340.x
16. W.-C. Yang et al., Appl. Phys. Lett. 85, 2316 (2004).
17. G. F. Rempfer and O. H. Griffith, Ultramicroscopy 4, 35 (1992).
18. H. Kleinschmidt and O. Bostanjoglo, Rev. Sci. Instrum. 72, 3898 (2001).