Coherent femtosecond low-energy single-electron pulses for time-resolved diffraction and imaging: A numerical study

Journal of Applied Physics

Volumn 112, Issue 11, 2012, Pages

  Paarmann, A ^a   Gulde, M ^b   Muller M ^a   Schafer S ^b   Schweda, S ^b   Maiti, M ^b   Xu, C ^a,c   Hohage, T ^b   Schenk, F ^b   Ropers, C ^b   Ernstorfer, R ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM COLLIMATION; BEAM PARAMETER; DIFFERENT GEOMETRY; ELECTRON PULSE; EXPERIMENTAL PARAMETERS; FEMTOSECOND TIME RESOLUTION; FEMTOSECONDS; FIELD-EMISSION ELECTRONS; FOCUSED ELECTRON BEAMS; FS PULSE; FULL CONTROL; LOW ENERGY ELECTRONS; NON DESTRUCTIVE; OPTIMAL PERFORMANCE; SINGLE ELECTRON; SINGLE-ELECTRON PULSE; TIME-RESOLVED DIFFRACTION; ULTRAFAST ELECTRON DIFFRACTION;

ELECTRONS; ELECTROSTATIC LENSES;

ELECTRON BEAMS;

EID: 84871191501     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4768204     Document Type: Article

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