Nanosecond white-light Laue diffraction measurements of dislocation microstructure in shock-compressed single-crystal copper

Nature Communications

Volumn 3, Issue , 2012, Pages

  Suggit, Matthew J ^a   Higginbotham, Andrew ^a   Hawreliak, James A ^b   Mogni, Gabriele ^a   Kimminau, Giles ^a   Dunne, Patrick ^a   Comley, Andrew J ^c   Park, Nigel ^c   Remington, Bruce A ^b   Wark, Justin S ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c AWE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER;

COMPRESSION; LATTICE DYNAMICS; MODEL VALIDATION; NANOTECHNOLOGY; SHEAR STRESS; TIMESCALE; X-RAY DIFFRACTION;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; LASER; LEISURE; MEASUREMENT; MOLECULAR DYNAMICS; PRESSURE; SHOCK; STRESS; WHITE LIGHT; WHITE LIGHT X RAY LAUE DIFFRACTION; X RAY DIFFRACTION;

EID: 84870783254     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms2225     Document Type: Article

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