Multiple film plane diagnostic for shocked lattice measurements (invited)

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 1929-1934

  Kalantar, Daniel H ^a   Bringa, E ^a   Caturla, M ^a   Colvin, J ^a   Lorenz, K T ^a   Kumar, M ^a   Stolken J ^a   Allen, A M ^b   Rosolankova, K ^b   Wark, J S ^b   Meyers, M A ^c   Schneider, M ^c   Boehly, T R ^d  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACTION; COPPER; CRYSTAL LATTICES; ELASTIC MODULI; LASER BEAM EFFECTS; PARTICLE DETECTORS; PHASE TRANSITIONS; PLASMA SHOCK WAVES; SILICON; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

MULTIPLE WAVE STRUCTURES;

PLASMA DIAGNOSTICS;

EID: 0037350093     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1538325     Document Type: Conference Paper

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