Effects of interface defects on charge transfer and photoinduced properties of TiO2 bilayer films

Journal of Physical Chemistry C

Volumn 116, Issue 48, 2012, Pages 25354-25361

  Zhuang, Jiandong ^a,b   Weng, Sunxian ^b   Dai, Wenxin ^b   Liu, Ping ^b   Liu, Qian ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b FUZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER FILMS; COLD PLASMA TREATMENT; DEFECT SITES; ELECTRON HOLE PAIRS; ELECTRON TRAPPING; FILM SURFACES; HIGHER EFFICIENCY; INTERFACE DEFECTS; LOW COSTS; ORGANIC DYE; PHOTO CATALYTIC DEGRADATION; PHOTOCATALYTIC ACTIVITIES; PHOTOGENERATED CARRIERS; PHOTOINDUCED HYDROPHILICITY; PHOTOINDUCED PROPERTIES; PHOTOINDUCED SUPER-HYDROPHILICITY; PHOTONIC EFFICIENCIES; SOL GEL DIP COATING; TIO; UV IRRADIATION; WATER CONTACT ANGLE MEASUREMENT;

CHARGE TRANSFER; CONTACT ANGLE; INTERFACE STATES; MAGNETIC FILMS; MULTILAYER FILMS; PHOTOCATALYSIS; PHOTODEGRADATION; PHOTOELECTRONS; PLASMA APPLICATIONS; SURFACE DEFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

TITANIUM DIOXIDE;

EID: 84870771445     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp307871y     Document Type: Article

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