Effect of waviness and roughness components on transverse profiles of turned surfaces

Measurement: Journal of the International Measurement Confederation

Volumn 46, Issue 1, 2013, Pages 688-696

  Boryczko, A ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Components of surface irregularities; Roughness; Spectral analysis; Surface geometrical structure; Waviness

Indexed keywords

GEOMETRY; QUALITY CONTROL; SPECTROSCOPY; SPECTRUM ANALYSIS;

COMPARATIVE ASSESSMENT; CUMULATIVE AMPLITUDE; DIFFERENT FREQUENCY; FREQUENCY RANGES; FREQUENCY SPECTRA; GEOMETRICAL STRUCTURE; RELATIVE CONTRIBUTION; ROUGHNESS COMPONENTS; SIMULTANEOUS ANALYSIS; STANDARD COMPOSITION; SURFACE IRREGULARITIES; SURFACE MACHINING; TRANSVERSE PROFILE; TWO-COMPONENT; WAVINESS;

SURFACE ROUGHNESS;

EID: 84870248871     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2012.09.007     Document Type: Article

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