Determination of appropriate sampling conditions for three-dimensional microtopography measurement

International Journal of Machine Tools and Manufacture

Volumn 36, Issue 12, 1996, Pages 1347-1362

  Dong, W P ^a   Mainsah, E ^b   Stout, K J ^c  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b Institute for Clean Growth and Future Mobility   (United Kingdom)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ROUGHNESS MEASUREMENT; SAMPLING; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

NYQUIST WAVELENGTH; THREE DIMENSIONAL MICROTOPOGRAPHY MEASUREMENT;

MACHINE TOOLS;

EID: 0030380298     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(96)00034-X     Document Type: Article

References (24)

1. K. J. Stout (Ed.), Proc. 4th Int. Conference on Metrology and Properties of Engineering Surfaces, Washington. Kogan Page (1988).
2. K. J. Stout (Ed.), Proc. 5th Int. Conference on Metrology and Properties of Engineering Surfaces, Leicester. Pergamon Press, Oxford (1991).
3. K. J. Stout (Ed.), Proc. 6th Int. Conference on Metrology and Properties of Engineering Surfaces, Birmingham. Pergamon Press, Oxford (1994).
4. Rules and procedures for the measurement of surface roughness using stylus instruments, International Standard ISO 4288 (1985).
5. Instruments for the measurement of surface roughness by the profile method - contact (stylus) instruments of consecutive profile transformation contact profile meters, System M, International Standard ISO 3274 (1975).
6. T. Tsukada and K. Sasajima, An optimum sampling interval for digitising surface asperity profiles, Wear 83, 119-128 (1982).
7. a roughness measurement, Proc. Inst. Mech. Engrs C205, 139-142 (1991).
8. D. D. Chetwynd, The digitisation of surface profiles, Wear 57, 137-145 (1979).
9. T. R. Thomas and G. Charlton, Variation of roughness parameters on some typical manufactured surfaces, Precision Engng 3, 91-96 (1981).
10. W. P. Dong, P. J. Sullivan and K. J. Stout, The significance of surface features in characterising 2-D and 3-D surface topography, ASME PED 62, 115 (1992).
11. J. S. Bendat and A. G. Piersol, Random Data: Analysis and Measurement Procedures. Wiley-Interscience, New York (1971).
12. J. G. Proakis and D. G. Manolakis, Digital Signal Processing, Principles, Algorithms, and Applications. Macmillan, Basingstoke (1992).
13. T. Y. Lin, L. Blunt and K. J. Stout, Determination of proper frequency bandwidth for 3-D topography measurement using spectral analysis Part 1: Isotropic surfaces, Wear 166, 221-232 (1993).
14. E. Mainsah, Investigation of pre-characterisation aspects of three-dimensional micro-topography. Ph.D. Thesis, University of Birmingham, U.K. (1994).
15. T. R. Thomas, Roughness Surfaces. Longman, London (1982).
16. T. Nakamura, On deformation of surface roughness curves caused by finite radius of stylus tip and tilting of stylus holder arm, Bull. Japan Soc. Prec. Engng 1, 240-249 (1966).
17. J. L. Guerrero and J. T. Black, Stylus tracer resolution and surface damage as determined by scanning electron microscopy, Trans. ASME J. Engng Ind. 94, 1087-1093 (1972).
18. I. Sherrington and E. H. Smith, A quantitative study of the influence of stylus shape and load on the fidelity of data recorded by stylus instruments, Proc. Second National Conference on Production Research, Edinburgh, pp. 762-783. University of Edinburgh Press (1986).
19. T. R. Thomas, Some examples of the versatility of stylus instruments , Mecanique, Materiaux, Electricite 337, 17-25 (1978).
20. D. J. Whitehouse, Some ultimate limits on the measurement of surfaces using stylus techniques, Measurement Control 8, 147-151 (1975).
21. V. Radhakrishnan, Effect of stylus radius on the roughness values measured with tracing stylus instruments, Wear 16, 325-335 (1970).
22. K. J. Stout, P. J. Sullivan, W. P. Dong, E. Mainsah, N. Luo, T. Mathia and H. Zahouani, The Development of Methods for the Characterisation of Roughness in Three-dimensions. Commission of the European Communities, ISBN 0 7044 1313 2 (1993).
23. W. P. Dong, E. Mainsah, P. J. Sullivan and K. J. Stout, Instruments and measurement techniques of 3-dimensional surface topography, Three-Dimensional Surface Topography; Measurement, Interpretation and Applications, A Survey and Bibliography (edited by K. J. Stout). Penton Press, London (1994).
24. Metrological characterisation of phase corrected filters and transmission bands for use in contact (stylus) instruments, Draft International Standard ISO/DIS 11562 (1994).