Metrological characteristics of wavelet filter used for engineering surfaces

Measurement: Journal of the International Measurement Confederation

Volumn 39, Issue 7, 2006, Pages 575-584

  Lingadurai, K ^a   Shunmugam, M S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Random process analysis; Reference surface; Surface texture; Wavelet filter

Indexed keywords

ERROR ANALYSIS; MEASUREMENTS; SURFACE PROPERTIES; SURFACE ROUGHNESS;

RANDOM PROCESS ANALYSIS; REFERENCE SURFACE; SURFACE TEXTURE;

WAVE FILTERS;

EID: 33745211436     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2006.02.003     Document Type: Article

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