Enhanced sensitivity to surface plasmon resonance phase in wavelength-modulated heterodyne interferometry

Optics Communications

Volumn 289, Issue , 2013, Pages 28-32

  Lee, Ju Yi ^a   Mai, Li Wei ^a   Hsu, Cheng Chih ^b   Sung, Yuan Yuan ^b  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Refractive index; Surface plasmon resonance; Wavelength modulated heterodyne interferometry

Indexed keywords

AZIMUTHAL ANGLE; ENHANCED SENSITIVITY; HETERODYNE DETECTION; HETERODYNE INTERFEROMETRY; IN-SITU MONITORING; MEASUREMENT SENSITIVITY; OPTICAL CONFIGURATIONS; PHASE VARIATION; QUARTER WAVE-PLATE; SPR SENSORS; TEST SAMPLES;

HETERODYNING; LIGHT MEASUREMENT; PLASMONS; REFRACTIVE INDEX; WAVELENGTH;

SURFACE PLASMON RESONANCE;

EID: 84869505882     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2012.10.005     Document Type: Article

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