High-sensitivity small-angle sensor based on surface plasmon resonance technology and heterodyne interferometry

Applied Optics

Volumn 45, Issue 26, 2006, Pages 6702-6707

  Wang, Shinn Fwu ^a   Chiu, Ming Hung ^b   Lai, Chih Wen ^b   Chang, Rong Seng ^c  

^a CHING YUN UNIVERSITY   (Taiwan)

^b NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; PRISMS; SURFACE PLASMON RESONANCE;

HIGH SENSITIVITY; MEASUREMENT RANGE; OPTICAL SETUP; RIGHT-ANGLE PRISMS;

SENSORS;

EID: 33750163075     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.006702     Document Type: Article

References (22)

1. P. Shi and E. Stijns, "Improving the linearity of the Mechelson interferometric angular measurement by a parametercompensation method," Appl. Opt. 32, 44-51 (1993).
2. P. S. Huang and J. Ni, "Angle measurement based on the internal-reflection effect and the use of right-angle prisms," Appl. Opt. 34, 4976-4981 (1995).
3. P. S. Huang and J. Ni, "Angle measurement based on the internal-reflection effect using elongated critical-angle prisms," Appl. Opt. 35, 2239-2241 (1996).
4. P. S. Huang, "Use of thin films for high-sensitivity angle measurement," Appl. Opt. 38, 4831-4836 (1999).
5. M. H. Chiu and D. C. Su, "Angle measurement using totalinternal-reflection heterodyne interferometry," Opt. Eng. 36, 1750-1753 (1997).
6. M. H. Chiu and D. C. Su, "Improved technique for measuring small angles," Appl. Opt. 36, 7104-7106 (1997).
7. M. H. Chiu, S. F. Wang, and R. S. Chang, "Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry," Appl. Opt. 43, 5438-5442 (2004).
8. W. Zhou and L. Cai, "Interferometer for small-angle measurement based on total internal reflection," Appl. Opt. 37, 5957-5963 (1998).
9. P. Shi and E. Stijns, "New optical method for measuring smallangle rotations," Appl. Opt. 27, 4342-4346 (1988).
10. W. M. Robertson and E. Fullerton, "Reexamination of the surface-plasma-wave technique for determining the dielectric constant and thickness of metal films," J. Opt. Soc. Am. B 6, 1584-1589(1989).
11. P. Pfeifer, U. Aldinger, G. Schwotzer, and S. Diekmann, "Real time sensing of specific molecular binding using surface plas-mon resonance spectroscopy," Sens. Actuators B 54, 166-175 (1999).
12. B. Lieberg, C. Nylander, and I. Lundström, "Surface plasmon resonance for gas detection and biosensing," Sens. Actuators 4, 299-304 (1983).
13. H. Melendez, R. Carr, D. U. Bartholomew, K. Kukanskis, J. Elkind, S. Yee, C. Furlong, and R. Woodbury, "A commercial solution for surface plasmon sensing," Sens. Actuators B 35, 212-216 (1996).
14. Y. Xinglong, Z. Lequn, J. Hong, and W. Haojuan, "Immunosensor based on optical heterodyne phase detection," Sens. Actuators B 76, 199-202 (2001).
15. L. Lévesque and B. E. Paton, "Detection of defects in multiplelayer structures by using surface plasmon resonance," Appl. Opt. 36, 7199-7203 (1997).
16. G. Margheri, A. Mannoni, and F. Quercioli, "High-resolution angular and displacement sensing based on the excitation of surface plasma waves," Appl. Opt. 36, 4521-4525 (1997).
17. S. Shen, T. Liu, and J. Guo, "Optical phase-shift detection of surface plasmon resonance," Appl. Opt. 37, 1747-1751 (1998).
18. J. Guo, Z. Zhu, W. Deng, and S. Shen, "Angle measurement using surface-plasmon-resonance heterodyne interferometry: a new method," Opt. Eng. 37, 2998-3001 (1998).
19. E. Kretshmann, "Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflächenplasmaschwingungen," Z. Phys. 241, 313-324 (1971).
20. Y. C. Cheng, W. K. Su, and J. H. Liou, "Application of a liquid sensor based on surface plasmon wave excitation to distinguish methyl alcohol from ethyl alcohol," Opt. Eng. 39, 311-314 (2000).
21. H. E. de Bruijn, R. P. H. Kooyman, and J. Greve, "Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment," Appl. Opt. 29, 1974-1978 (1990).
22. C. C. Lee and Y. J. Jen, "Influence of surface roughness on the calculation of optical constants of a metallic film by attenuated total reflection," Appl. Opt. 38, 6029-6033 (1999).