Surface plasmon resonance monitoring of temperature via phase measurement

Optics Communications

Volumn 241, Issue 4-6, 2004, Pages 409-418

  Chiang, H P ^a,b   Yeh, H T ^b   Chen, C M ^b   Wu, J C ^b   Su, S Y ^b   Chang, R ^b   Wu, Y J ^b   Tsai, D P ^c   Jen, S U ^a,b   Leung, P T ^a,d  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^d PORTLAND STATE UNIVERSITY   (United States)

Author keywords

Phase measurement; Surface plasmon resonance; Temperature effects

Indexed keywords

FUNCTIONS; MATHEMATICAL MODELS; METALLIC FILMS; PARAMETER ESTIMATION; PHASE MEASUREMENT; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE; THERMAL EFFECTS;

OPTICAL CONSTANTS; PHASE DIFFERENCE; SENSITIVE MEASUREMENT; TEMPERATURE DEPEDENCE;

TEMPERATURE MEASUREMENT;

EID: 7544249738     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.07.045     Document Type: Article

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