Phase detection of surface plasmon resonance using rotating analyzer method

Sensors and Actuators, B: Chemical

Volumn 107, Issue 2, 2005, Pages 952-956

  Naraoka, Ryo ^a,b   Kajikawa, Kotaro ^a,b  

^a Tokyo Institute of Technology ^*  (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Ellipsometry; Kretschmann configuration; Phase measurement; Rotating analyzer method; Surface plasmon resonance

Indexed keywords

ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; PHASE MEASUREMENT; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE;

INCIDENT LIGHT; KRETSCHMANN CONFIGURATION; PHASE DETECTION; ROTATING ANALYZERS;

OPTICAL SENSORS;

EID: 18544380214     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2004.12.044     Document Type: Article

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