Phase detection of surface plasmon resonance using rotating analyzer method

Sensors and Actuators, B: Chemical

Volumn 107, Issue 2, 2005, Pages 952-956

  Naraoka, Ryo ^a,b   Kajikawa, Kotaro ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Ellipsometry; Kretschmann configuration; Phase measurement; Rotating analyzer method; Surface plasmon resonance

Indexed keywords

ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; PHASE MEASUREMENT; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE;

INCIDENT LIGHT; KRETSCHMANN CONFIGURATION; PHASE DETECTION; ROTATING ANALYZERS;

OPTICAL SENSORS;

EID: 18544380214     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2004.12.044     Document Type: Article

References (15)

1. E. Kretschmann Z. Phys. 241 1971 313
2. A. Otto Z. Phys. 216 1968 2135
3. H. Raether Surface Plasmon on Smooth and Rough Surfaces and on Gratings 1988 Springer-Verlag Berlin
4. J. Homala, S.S. Yee, and G. Gauglitz Sens. Actuators B 54 1999 3
5. B. Liedberg, C. Nylander, and I. Lundstrom Biosens. Bioelectron. 10 1995 i-ix.
6. S.G. Nelson, K.S. Johnston, and S.S. Yee Sens. Actuators B 35/36 1996 187.
7. Y. Xinglong, W. Dingxin, and Y. Zibo Sens. Actuators B 91 2003 285
8. F. Abels Surf. Sci. 56 1976 237
9. S. Shen, T. Liu, and J. Guo Appl. Opt. 37 10 1998 1747
10. P. Westphal, and A. Bornmann Sens. Actuators B 84 2002 278
11. Y. Xinglong, W. Dingxin, and Y. Zibo Sens. Actuators B 76 2001 199
12. M. Poksinski, and H. Arwin Sens. Actuators B 94 2003 247
13. C.-M. Wu, Z.-C. Jian, S.-F. Joe, and L.-B. Chang Sens. Actuators B 92 2003 133
14. V. Vaicikauskas, J. Bremer, O. Hunderi, R. Antanavicius, and R. Januskevicius Thin Solid Films 411 2002 262
15. R.M.A. Azzam, and N.M. Bashara Ellipsometry and Polarized Light 1977 North-Holland New York