Investigation of matrix effects in 193 nm laser ablation-inductively coupled plasma-mass spectrometry analysis using reference glasses of different transparencies

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 78, Issue , 2012, Pages 20-28

  Czas, J ^a,b   Jochum, K P ^a   Stoll, B ^a   Weis, U ^a   Yang, Q C ^a   Jacob, D E ^b   Andreae, M O ^a  

^a MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Geological glass; LA ICP MS; Matrix effect; Reference material; Silicate glass

Indexed keywords

193 NM LASER; CONCENTRATION DATA; CONFIDENCE LEVELS; FE CONTENT; FRACTIONATION FACTORS; LA-ICP-MS; LA-ICP-MS ANALYSIS; LASER-ABLATION INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY; LITHOPHILE ELEMENTS; MASS LOAD; MATRIX EFFECTS; MICROMETER SCALE; ND : YAG LASERS; REFERENCE GLASS; REFERENCE MATERIAL; REFERENCE VALUES; RELATIVE SENSITIVITY FACTOR; REPRODUCIBILITIES; SILICATE GLASS; SPOT SIZES; TRACE ELEMENT CONCENTRATIONS; UNCERTAINTY LIMITS;

CALIBRATION; GLASS; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LASER ABLATION; LASERS; LEAD; MASS SPECTROMETERS; NEODYMIUM LASERS; RUBIDIUM; SILICATES; STRONTIUM; TRANSPARENCY;

UNCERTAINTY ANALYSIS;

EID: 84869495884     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2012.09.004     Document Type: Article

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