High-Resolution LA-ICP-MS for Accurate Determination of Low Abundances of K, Sc and Other Trace Elements in Geological Samples

Geostandards and Geoanalytical Research

Volumn 34, Issue 1, 2010, Pages 19-38

  Regnery, Julia ^a   Stoll, Brigitte ^a   Jochum, Klaus Peter ^a  

^a MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

Author keywords

Geological reference materials; High mass resolution; LA ICP MS; MPI DING glasses

Indexed keywords

EID: 77952729149     PISSN: 16394488     EISSN: 1751908X     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2009.00025.x     Document Type: Article

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