Double-focusing sector field inductively coupled plasma mass spectrometry for highly sensitive multi-element and isotopic analysis: Invited lecture

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 9, 1997, Pages 881-889

  Becker, J Sabine ^a   Dietze, Hans Joachim ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Double focusing sector field mass spectrometry; Environmental samples; High purity GaAs; Inductively coupled plasma; Long lived radionuclides; Molecular ions; Tantalum; Ultratrace analysis

Indexed keywords

EXTRACTION; NEUTRON SOURCES; PLASMA APPLICATIONS; RADIOISOTOPES; SEMICONDUCTING GALLIUM ARSENIDE; SOLUTIONS; TANTALUM; TRACE ANALYSIS; TRACE ELEMENTS;

DOUBLE FOCUSING SECTOR FIELD MASS SPECTROMETRY; LIQUID LIQUID EXTRACTION;

MASS SPECTROMETRY;

EID: 0031234960     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a702178j     Document Type: Article

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