|
Volumn , Issue , 2010, Pages 2443-2447
|
Effect of the Mo back contact microstructure on the preferred orientation of CIGS thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BACK CONTACT;
CIGS THIN FILMS;
GRAIN DENSITY;
PREFERRED ORIENTATIONS;
TEM;
WORKING PRESSURES;
XRD ANALYSIS;
PHOTOVOLTAIC EFFECTS;
RESIDUAL STRESSES;
SODIUM;
TEXTURES;
PRESSURE EFFECTS;
|
EID: 78650093856
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2010.5614175 Document Type: Conference Paper |
Times cited : (29)
|
References (9)
|