Characterization and understanding of performance losses in a highly efficient solution-processed CZTSSe thin-film solar cell

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 1471-1474

  Roy Choudhury, Kaushik ^a   Cao, Yanyan ^a   Caspar, Jonathan V ^a   Farneth, William E ^a   Guo, Qijie ^a   Ionkin, Alex S ^a   Johnson, Lynda K ^a   Lu, Meijun ^a   Malajovich, Irina ^a   Radu, Daniela ^a   Rosenfeld, H David ^a   Wu, Wei ^a  

^a DUPONT COMPANY   (United States)

Author keywords

capacitance measurement; charge carrier density; copper compounds; current voltage characteristics; photovoltaic cells; thin film devices

Indexed keywords

ADMITTANCE SPECTROSCOPIES; BULK DEFECTS; CAPACITANCE PROFILING; DEFECT ANALYSIS; INTERFACE RECOMBINATION; LOSS MECHANISMS; PERFORMANCE LOSS; PERSISTENT PHOTOCONDUCTIVITY; RED LIGHT; SOLUTION-PROCESSED; THIN-FILM SOLAR CELLS;

CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; CHARGE CARRIERS; COPPER COMPOUNDS; PHOTOVOLTAIC CELLS; THIN FILM DEVICES;

SOLAR CELLS;

EID: 84869416559     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317874     Document Type: Conference Paper

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