Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary mass spectrometry, gas chromatography/mass spectrometry, X-ray photoelectron spectroscopy, and attenuated total reflection Fourier transform infrared spectroscopic imaging: An intercomparison

Analytical Chemistry

Volumn 84, Issue 20, 2012, Pages 8514-8523

  Bailey, Melanie J ^a   Bright, Nicholas J ^a   Croxton, Ruth S ^b   Francese, Simona ^c   Ferguson, Leesa S ^c   Hinder, Stephen ^a   Jickells, Sue ^d   Jones, Benjamin J ^e   Jones, Brian N ^a   Kazarian, Sergei G ^f   Ojeda, Jesus J ^e   Webb, Roger P ^a   Wolstenholme, Rosalind ^c   Bleay, Stephen ^g  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b UNIVERSITY OF LINCOLN   (United Kingdom)

^c SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^d UNIVERSITY OF EAST ANGLIA   (United Kingdom)

^e BRUNEL UNIVERSITY   (United Kingdom)

^f IMPERIAL COLLEGE LONDON   (United Kingdom)

^g Home Office Centre for Applied Science and Technology   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACADEMIC RESEARCH; ATTENUATED TOTAL REFLECTION FOURIER TRANSFORM INFRARED; CHEMICAL CHARACTERIZATION; ENDOGENOUS COMPOUND; GAS CHROMATOGRAPHY/MASS SPECTROMETRY; HIGH ENERGY; INTERCOMPARISONS; LATENT FINGERPRINT; MATRIX-ASSISTED LASER DESORPTION IONIZATION; MEGA-ELECTRON-VOLT; RELATIVE ABUNDANCE; REPRODUCIBILITIES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

CHROMATOGRAPHY; ELECTROMAGNETIC WAVE REFLECTION; LASERS; PHOTOELECTRONS; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

IONIZATION OF GASES;

ARTICLE; COMPARATIVE STUDY; DERMATOGLYPHICS; HUMAN; INFRARED SPECTROSCOPY; MASS FRAGMENTOGRAPHY; MASS SPECTROMETRY; METHODOLOGY;

DERMATOGLYPHICS; GAS CHROMATOGRAPHY-MASS SPECTROMETRY; HUMANS; SPECTROMETRY, MASS, MATRIX-ASSISTED LASER DESORPTION-IONIZATION; SPECTROMETRY, MASS, SECONDARY ION; SPECTROSCOPY, FOURIER TRANSFORM INFRARED;

EID: 84869410635     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac302441y     Document Type: Article

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