ToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugs

Forensic Science International

Volumn 184, Issue 1-3, 2009, Pages

  Szynkowska, M I ^a   Czerski, K ^a   Rogowski, J ^a   Paryjczak, T ^a   Parczewski, A ^b,c  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF FORENSIC RESEARCH   (Poland)

^c JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

Drugs; Fingerprints; Forensic research; Images; Secondary ion mass spectrometry

Indexed keywords

3,4 METHYLENEDIOXYMETHAMPHETAMINE; ALUMINUM; AMPHETAMINE; GLASS; METHAMPHETAMINE; STEEL;

ARTICLE; CONTROLLED STUDY; FINGER DERMATOGLYPHICS; FORENSIC SCIENCE; PRIORITY JOURNAL; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 58249142181     PISSN: 03790738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.forsciint.2008.11.003     Document Type: Article

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