Real time analysis of ultra-thin CIGS thin film deposition

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 452-454

  Ranjan, Vikash ^a   Aryal, Krishna ^a   Little, Scott ^b   Erkaya, Yunus ^a   Rajan, Grace ^a   Boland, Patrick ^a   Attygalle, Dinesh ^b   Aryal, Puruswottam ^b   Pradhan, Puja ^b   Collins, Robert W ^b   Marsillac, Sylvain ^a  

^a Old Dominion University   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

ellipsometry; gallium based semiconductor materials; optical variables measurement; photovoltaic cells; semiconductor film; thickness measurement

Indexed keywords

CIGS FILMS; CIGS THIN FILMS; CO-EVAPORATIONS; COPPER CONTENT; CU(IN , GA)SE; DIELECTRIC FUNCTIONS; GROWTH PROCESS; REAL TIME ANALYSIS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; ROUGHNESS EVOLUTION; SEMICONDUCTOR FILMS; THERMALLY OXIDIZED SILICON; ULTRA-THIN;

ELLIPSOMETRY; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; PHOTOVOLTAIC CELLS; SEMICONDUCTING SELENIUM COMPOUNDS; SILICON OXIDES; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

COPPER;

EID: 84869400857     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317655     Document Type: Conference Paper

References (5)

1. R.W. Collins, A.S. Ferlauto, G.M. Ferreira, C. Chen, l Koh, R.I. Koval, Y. Lee, J.M. Pearce, and C.R. Wronski, Sol Ener. Mater. Sol Cells, Vol. 78, p. 143, 2003.
2. th IEEE Photovoltaics Specialists Canf., June 7-12, 2009, Philadelphia, PA, (IEEE, Piscataway NJ, 2008), p. 1783.
3. T. Begou, J.D. Walker, D. Attygalle, V. Ranjan, R.W. Collins and S. Marsillac, Physica Status Solidi (RRL) - Rapid Research Letters, Vol. 5, p. 217, 2011.
4. D. Abou-Ras, T. Kirchartz, U. Rau (eds.), Advanced Characterization Techniques for Thin Film Solar Cells (Wiley-VCH, Berlin, 2011), p. 141.
5. l D. Walker, H. Khatri, V. Ranjan, l Li, R. W. Collins, and S. Marsillac, Appl Phys. Lett, Vol. 94, p.141908, 2009.