Focused ion beam assisted investigations of Al interface in polythiophene:Fullerene solar cells

Solar Energy Materials and Solar Cells

Volumn 109, Issue , 2013, Pages 56-62

  Rujisamphan, Nopporn ^a   Deng, Fei ^a   Murray, Roy E ^a   Ni, Chaoying ^a   Ismat Shah, S ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

FIB sample preparation; Mixing layer; P3HT PCBM organic solar cells; TEM image

Indexed keywords

ACTIVE LAYER; AL ELECTRODE; AMORPHOUS-LIKE; ATOMIC PLANES; BRIGHT FIELDS; BROAD RING; CONTACT RESISTIVITIES; DIFFRACTION SPOTS; DISCRETE DIFFRACTION; ELECTRODE INTERFACE; ELEMENTAL MAPPING; METHYL ESTERS; MIXED LAYER; MIXING LAYERS; NANOBEAM ELECTRON DIFFRACTION; ORGANIC ACTIVE LAYERS; ORGANIC LAYERS; ORGANIC SOLAR CELL; PEDOT:PSS; POLY-3 ,4-ETHYLENEDIOXYTHIOPHENE; POLY-THIOPHENE; REGIO-REGULAR; SAMPLE PREPARATION; TEM IMAGES; TEM SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY TEM; VERTICAL TRANSMISSION;

ANNEALING; CONDUCTING POLYMERS; CONTACT RESISTANCE; FOCUSED ION BEAMS; SOLAR CELLS; TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION LINE THEORY;

ALUMINUM;

EID: 84868694039     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2012.09.022     Document Type: Article

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