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Volumn 27, Issue 21, 2012, Pages 2752-2759

Measurement of Young's modulus of anisotropic materials using microcompression testing

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC MATERIAL; FINITE ELEMENT SIMULATIONS; INDENTATION MODULUS; MICROCOMPRESSION; SINGLE CRYSTALLINE SILICON; SINGLE-CRYSTALLINE; SUBSTRATE DEFORMATION; SYSTEMATIC FRAMEWORK; THEORETICAL VALUES; YOUNG'S MODULUS;

EID: 84868555121     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2012.18     Document Type: Article
Times cited : (20)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.