Nanostructured TiO 2 thin films: Synthesis and characterisations

Materials Technology

Volumn 27, Issue 5, 2012, Pages 342-349

  Akin, S ^a   Sonmezoglu S ^a  

^a KARAMANOGLU MEHMETBEY UNIVERSITY   (Turkey)

Author keywords

Dielectric constant; Nanostructured TiO 2 thin films; Refractive index; Swanepoel's method; Williamson Hall plot

Indexed keywords

BAND GAP ENERGY; DIELECTRIC CHARACTERISTICS; DIFFRACTION SPECTRA; DISSIPATION FACTORS; EXTINCTION COEFFICIENTS; FIELD EMISSION SEM; FUNDAMENTAL CHARACTERISTICS; HIGH-FREQUENCY DIELECTRICS; IMAGINARY PARTS; NANOSTRUCTURED TIO; OPTICAL PARAMETER; REAL PART; SOL-GEL DIP COATING TECHNIQUE; STRUCTURAL PARAMETER; SWANEPOEL'S METHOD; TEXTURE COEFFICIENT; TIO; TRANSMITTANCE MEASUREMENTS; URBACH ENERGY; WILLIAMSON-HALL; WILLIAMSON-HALL PLOT;

CRYSTALLITE SIZE; DIELECTRIC MATERIALS; OPTICAL CONDUCTIVITY; OPTOELECTRONIC DEVICES; PERMITTIVITY; REFRACTIVE INDEX; THIN FILMS; X RAY DIFFRACTION;

TITANIUM DIOXIDE;

EID: 84868022156     PISSN: 10667857     EISSN: 17535557     Source Type: Journal    
DOI: 10.1179/1753555712Y.0000000017     Document Type: Article

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