Evidence for the role of holes in blinking: Negative and oxidized CdSe/CdS dots

ACS Nano

Volumn 6, Issue 10, 2012, Pages 9125-9132

  Qin, Wei ^a   Guyot Sionnest, Philippe ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

blinking; electrochemistry; hole trapping; photocharging; surface oxidation

Indexed keywords

BLINKING; BLINKING STATISTICS; CDS; CDSE/CDS; COLLOIDAL QUANTUM DOTS; CORE DIAMETERS; DURATION TIME; ELECTROCHEMICAL CHARGING; ELECTROCHEMICAL CONTROL; ELECTRON CONFINEMENT; ELECTRON-ACCEPTING; FINITE DURATION; FOUR ELECTRONS; HOLE-TRAPPING; MULTIPLE CHARGING; NEGATIVE CHARGE; NERNST EQUATION; PHOTOCHARGING; PHOTOLUMINESCENCE LIFETIME; PL INTENSITY; PL LIFETIME; SEQUENTIAL CHANGES; SURFACE OXIDATIONS; THICK SHELLS; THIN SHELLS; ZNO NANOCRYSTAL;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; ELECTROCHEMISTRY; GLASS; PLASMA CONFINEMENT; ZINC OXIDE;

OXIDATION;

CADMIUM DERIVATIVE; CADMIUM SELENIDE; CADMIUM SULFIDE; QUANTUM DOT; SELENIUM DERIVATIVE; SULFIDE;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; OXIDATION REDUCTION REACTION;

CADMIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; OXIDATION-REDUCTION; QUANTUM DOTS; SELENIUM COMPOUNDS; SULFIDES;

EID: 84867799228     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn303396c     Document Type: Article

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