Low-Energy Ion Scattering (LEIS)

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

Volumn , Issue , 2011, Pages 203-215

  Bauer, Peter ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Charge exchange; Ion scattering spectroscopy; Low energy ion scattering; Quantitativeanalysis; Surface composition; Surface sensitivity

Indexed keywords

EID: 84886474967     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636921.ch12     Document Type: Chapter

References (19)

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11. Draxler, M., Markin, S.N., Ermolov, S.N., Schmid, K., Hesch, C., Gruber, R., Poschacher, A., Bergsmann, M., and Bauer, P. (2004) Vacuum, 73, 39.
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13. Brongersma, H.H., Groenen, P.A.C., and Jacobs, J. - P. (1994) Science of Ceramic Interfaces II (ed. J. Nowotny), Elsevier, pp. 113 - 182.
14. Denier van der Gon, A.W., Cortenraad, R., Jansen, W.P.A., Reijme, M.A., and Brongersma, H.H. (2000) Nucl. Instrum. Methods B, 56 - 64, 161 - 163.
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19. Viitanen, M.M., Jansen, W.P.A., van Welzenis, R., and Brongersma, H.H. (1999) J. Phys. Chem. B, 103, 6025 - 6029.