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Volumn 267, Issue 4, 2009, Pages 624-627

LEIS: A reliable tool for surface composition analysis?

Author keywords

Ag(1 1 1); Cu(1 0 0); Ion fraction; Low energy ion scattering; Neutralization; Single crystal

Indexed keywords

CRYSTAL ORIENTATION; HELIUM; IONS; PLASMA INTERACTIONS; SCATTERING; SILVER; SURFACE ANALYSIS; SURFACE STRUCTURE;

EID: 61349118617     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.10.050     Document Type: Article
Times cited : (14)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.