Electronically active defects in the Cu 2ZnSn(Se,S) 4 alloys as revealed by transient photocapacitance spectroscopy

Applied Physics Letters

Volumn 101, Issue 14, 2012, Pages

  Miller, D Westley ^a   Warren, Charles W ^a   Gunawan, Oki ^b   Gokmen, Tayfun ^b   Mitzi, David B ^b   Cohen, J David ^a  

^a UNIVERSITY OF OREGON   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEFECTS; DEFECT BANDS; PHOTOCAPACITANCE; TRANSIENT PHOTOCAPACITANCE SPECTROSCOPIES; URBACH ENERGY;

ENERGY GAP;

DEFECTS;

EID: 84867530145     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4754834     Document Type: Article

References (13)

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