SCOPUS 정보 검색 플랫폼

Volumn 22, Issue 43, 2012, Pages 23175-23180

Temporal stability of blue phosphorescent organic light-emitting diodes affected by thermal annealing of emitting layers

(4) Lee, Thomas Y H a Wang, Qiang a Wallace, Jason U b Chen, Shaw H a,c

a University of Rochester (United States)

b D'YOUVILLE COLLEGE (United States)

c UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE FAILURES; DEVICE LIFETIME; DRIVING VOLTAGES; EMITTING LAYER; FREE SURFACES; INDUCED CRYSTALLIZATION; MORPHOLOGICAL INSTABILITY; PINHOLE FORMATION; SATELLITE PEAKS; TEMPORAL STABILITY; THERMAL-ANNEALING;

LIGHT EMISSION; LIGHT EMITTING DIODES; PHOSPHORESCENCE;

ANNEALING;

EID: 84867499413 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm35050e Document Type: Article

Times cited : (24)

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