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Volumn 37, Issue 20, 2012, Pages 4317-4319

Impact of surface roughness on the effective dielectric constants and subwavelength image resolution of metal-insulator stack lenses

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; IMAGE RESOLUTION; METAL INSULATOR BOUNDARIES;

EID: 84867473171     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.004317     Document Type: Article
Times cited : (13)

References (16)
  • 15
    • 84867462316 scopus 로고    scopus 로고
    • University Of Purdue West Lafayette Indiana personal communication
    • S. M. Durbin, University of Purdue, West Lafayette, Indiana, "AFM roughness data for Ag and ZnO films" (personal communication, 2008).
    • (2008) AFM Roughness Data for Ag and ZnO Films
    • Durbin, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.