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Volumn 37, Issue 20, 2012, Pages 4317-4319
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Impact of surface roughness on the effective dielectric constants and subwavelength image resolution of metal-insulator stack lenses
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
IMAGE RESOLUTION;
METAL INSULATOR BOUNDARIES;
EFFECTIVE DIELECTRIC CONSTANTS;
MATERIAL DEPOSITION;
METAL INSULATORS;
SCATTERED FIELD;
SUB-WAVELENGTH;
SUBWAVELENGTH IMAGING;
SURFACE ROUGHNESS;
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EID: 84867473171
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.37.004317 Document Type: Article |
Times cited : (13)
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References (16)
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