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Volumn 136, Issue 2-3, 2012, Pages 967-972
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Optical analysis of Ge 19Se 81-xSb x thin films using single transmission spectrum
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Author keywords
Chalcogenides; Defects; Optical materials; Thin Films
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Indexed keywords
OPTICAL ANALYSIS;
OPTICAL APPLICATIONS;
SINGLE TRANSMISSION;
SPECTRAL RANGE;
TRANSMISSION SPECTRUMS;
CHALCOGENIDES;
DEFECTS;
GERMANIUM;
LIGHT TRANSMISSION;
OPTICAL MATERIALS;
REFRACTIVE INDEX;
THIN FILMS;
SEMICONDUCTING SELENIUM COMPOUNDS;
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EID: 84867402637
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2012.08.034 Document Type: Article |
Times cited : (34)
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References (36)
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