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Volumn 136, Issue 2-3, 2012, Pages 967-972

Optical analysis of Ge 19Se 81-xSb x thin films using single transmission spectrum

Author keywords

Chalcogenides; Defects; Optical materials; Thin Films

Indexed keywords

OPTICAL ANALYSIS; OPTICAL APPLICATIONS; SINGLE TRANSMISSION; SPECTRAL RANGE; TRANSMISSION SPECTRUMS;

EID: 84867402637     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2012.08.034     Document Type: Article
Times cited : (34)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.