Influence of the deposition technique on the structural and optical properties of amorphous AsS films

Applied Surface Science

Volumn 246, Issue 4, 2005, Pages 348-355

  Gonzalez Leal J M ^a   Stuchlik, M ^b   Vlcek, M ^c   Jimenez Garay R ^a   Marquez E ^b  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

As S films; PECVD; Spin coating; Thermal evaporation

Indexed keywords

AMORPHOUS MATERIALS; ARSENIC COMPOUNDS; EVAPORATION; MOLECULAR STRUCTURE; OPTICAL PROPERTIES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPIN COATING; THICKNESS MEASUREMENT; THIN FILMS;

AS-S FILMS; FILM THICKNESS; SURFACE PROFILE; THERMAL EVAPORATION;

METALLIC FILMS;

EID: 19944380751     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.11.050     Document Type: Conference Paper

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