Structure, optical and electrical properties of Ge30Sb10Se60 thin films

Physica B: Condensed Matter

Volumn 403, Issue 10-11, 2008, Pages 1848-1853

  Aly, K A ^a   Abousehly, A M ^a   Osman, M A ^b   Othman, A A ^b  

^a Al Azhar University   (Egypt)

^b Assiut University   (Egypt)

Author keywords

Annealing; Evaporation; Optical properties; Structure; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS MATERIALS; CHALCOGENIDES; ENERGY GAP; GERMANIUM COMPOUNDS; LIGHT ABSORPTION; THERMAL EVAPORATION; X RAY DIFFRACTION;

GLASS SUBSTRATES; MURMAN EXACT EQUATIONS; OPTICAL ABSORPTION COEFFICIENT;

THIN FILMS;

EID: 40949093616     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.10.019     Document Type: Article

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