Low TPA and free-carrier effects in silicon nanocrystal-based horizontal slot waveguides

Optics Express

Volumn 20, Issue 21, 2012, Pages 23838-23845

  Matres, J ^a   Lacava, C ^b   Ballesteros, G C ^a   Minzioni, P ^b   Cristiani, I ^b   Fedeli J M ^c   Marti J ^a   Oton, C J ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

^b UNIVERSITY OF PAVIA   (Italy)

^c CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL WAVEGUIDES;

CARRIER EFFECTS; CMOS COMPATIBLE; FREE-CARRIER EFFECTS; SILICON NANOCRYSTALS; SILICON WAVEGUIDE; SLOT WAVEGUIDE; SPLIT-STEP; STRIP WAVEGUIDES; ULTRAFAST NONLINEAR;

WAVEGUIDES;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; METHODOLOGY; NANOTECHNOLOGY; NONLINEAR SYSTEM; SURFACE PLASMON RESONANCE; THEORETICAL MODEL; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MODELS, THEORETICAL; NANOSTRUCTURES; NANOTECHNOLOGY; NONLINEAR DYNAMICS; SILICON; SURFACE PLASMON RESONANCE;

EID: 84867302489     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.023838     Document Type: Article

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