All-optical format conversion of NRZ-OOK to RZ-OOK in a silicon nanowire utilizing either XPM or FWM and resulting in a receiver sensitivity gain of ∼2.5 dB

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 16, Issue 1, 2010, Pages 234-249

  Astar, W ^a,b   Driscoll, Jeffrey B ^c   Liu, Xiaoping ^c   Dadap, Jerry I ^c   Green, William M J ^d   Vlasov, Yurii A ^d   Carter, Gary M ^a,b,e   Osgood Jr , Richard M ^c  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b Center for Advanced Studies in Photonic Research CASPR   (United States)

^c Howard Hughes Medical Institute   (United States)

^d IBM T J WATSON RESEARCH CENTER   (United States)

^e Baltimore County   (United States)

Author keywords

Cross phase modulation; Format conversion; Four wave mixing; Nonlinear optics; Silicon nanowires

Indexed keywords

10 GB/ S; ALL-OPTICAL FORMAT CONVERSION; ANTI-STOKES; CROSS-PHASE MODULATIONS; ERROR FLOOR; FORMAT CONVERSION; NON-RETURN-TO-ZERO; ON-OFF KEYING; RECEIVER SENSITIVITY; SILICON NANOWIRES;

BIT ERROR RATE; NANOWIRES; OPTICAL COMMUNICATION; OPTICAL FREQUENCY CONVERSION; OPTICAL MATERIALS; PHASE MODULATION;

FOUR WAVE MIXING;

EID: 76949084930     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2029872     Document Type: Article

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