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Volumn , Issue , 2012, Pages 238-244
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Novel interconnect methodologies for ultra-thin chips on foils
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRICAL CONDUCTIVITY;
EXPERIMENTAL INVESTIGATIONS;
INTEGRATION APPROACH;
INTERCONNECT RELIABILITY;
INTERCONNECTION TECHNOLOGY;
LASER SCRIBING;
LASER-INDUCED FORWARD TRANSFER;
MICROELECTRONIC SYSTEMS;
PRACTICAL IMPLEMENTATION;
PRINTED ELECTRONICS;
ROLL TO ROLL;
SILICON TECHNOLOGIES;
STANDARD TECHNOLOGY;
ULTRA-THIN CHIPS;
VIA FILLING;
ELECTRIC CONDUCTIVITY;
MICROELECTRONICS;
TECHNOLOGY;
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EID: 84866853919
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2012.6248834 Document Type: Conference Paper |
Times cited : (19)
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References (9)
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