Metric learning with two-dimensional smoothness for visual analysis

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2012, Pages 2533-2538

  Chen, Xinlei ^a   Tong, Zifei ^a   Liu, Haifeng ^b   Cai, Deng ^a  

^a State Key Lab of CADandCG   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONTENT BASED IMAGE RETRIEVAL; FACE IDENTIFICATION; IMAGE APPLICATIONS; IMAGE DATASETS; LAPLACIAN PENALTY; METRIC LEARNING; REAL NUMBER; SIDE INFORMATION; SPATIAL CORRELATIONS; VISUAL ANALYSIS;

COMPUTER VISION; LEARNING ALGORITHMS; PIXELS; VECTOR SPACES;

TWO DIMENSIONAL;

EID: 84866706953     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2012.6247970     Document Type: Conference Paper

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