Amorphous silicon nanowires combining high nonlinearity, FOM and optical stability

Optics Express

Volumn 20, Issue 20, 2012, Pages 22609-22615

  Grillet, C ^a,b   Carletti, L ^b   Monat, C ^b   Grosse, P ^c   Bakir, B Ben ^c   Menezo, S ^c   Fedeli, J M ^c   Moss, D J ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITÉ DE LYON   (France)

^c CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRES;

HIGH NONLINEARITY; NONLINEAR FIGURE OF MERITS; OPTICAL STABILITY; PEAK POWER; SYSTEMATIC STUDY; TIME-SCALES;

AMORPHOUS SILICON;

NANOTUBE; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; LIGHT; MATERIALS TESTING; PARTICLE SIZE; RADIATION SCATTERING; ULTRASTRUCTURE;

LIGHT; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOTUBES; PARTICLE SIZE; SCATTERING, RADIATION; SILICON;

EID: 84866649301     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.022609     Document Type: Article

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