X-ray photoelectron spectroscopy of Zn 0.98Cu 0.02O thin film grown on ZnO seed layer by RF sputtering

Materials Letters

Volumn 88, Issue , 2012, Pages 51-53

  Vij, Ankush ^a   Gautam, Sanjeev ^a   Won, Sung Ok ^a   Thakur, Anup ^b   Lee, Ik Jae ^c   Chae, Keun Hwa ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b PUNJABI UNIVERSITY   (India)

^c POSTECH   (South Korea)

Author keywords

Oxygen vacancies; Thin film; X ray photoelectron spectroscopy

Indexed keywords

AS-DEPOSITED FILMS; COLUMNAR STRUCTURES; CORE-LEVEL SPECTRA; CU-DOPING; NANOCRYSTALLINE THIN FILMS; RF-MAGNETRON SPUTTERING; RF-SPUTTERING; SEED LAYER; SINGLE PHASE; WURTZITE STRUCTURE; ZNO;

DEPOSITS; ELECTRONIC STRUCTURE; MAGNETRON SPUTTERING; OXYGEN VACANCIES; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE; ZINC SULFIDE;

COPPER;

EID: 84866611391     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.08.017     Document Type: Article

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