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Volumn , Issue , 2012, Pages 2481-2484

Hybrid cache architecture replacing SRAM cache with future memory technology

Author keywords

[No Author keywords available]

Indexed keywords

CACHE ARCHITECTURE; FUTURE MEMORY; HETEROGENEOUS MEMORY; HIGH DENSITY; MEMORY ACCESS TIME; MEMORY STRUCTURE; POWER REDUCTIONS; PROCESSING SPEED;

EID: 84866611037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2012.6271803     Document Type: Conference Paper
Times cited : (14)

References (14)
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    • A thermally-aware performance analysis of vertically integrated (3-D) processor-memory hierarchy
    • G. L. Loi, B. Agrawal, and N. Srivastava,"A thermally-aware performance analysis of vertically integrated (3-D) processor-memory hierarchy," in Design Automation Conference, 2006, pp. 991-996.
    • (2006) Design Automation Conference , pp. 991-996
    • Loi, G.L.1    Agrawal, B.2    Srivastava, N.3
  • 4
    • 33847743417 scopus 로고    scopus 로고
    • A novel nonvolatile memory with spin torque transfer magnetization switching: Spin-ram
    • M. Hosomi, H. Yamagishi, and T. Yamamoto,"A novel nonvolatile memory with spin torque transfer magnetization switching: spin-ram," in International Electron Devices Meeting, 2005, pp. 459-462.
    • (2005) International Electron Devices Meeting , pp. 459-462
    • Hosomi, M.1    Yamagishi, H.2    Yamamoto, T.3
  • 5
    • 34247864561 scopus 로고    scopus 로고
    • 2Mb spin-transfer torque RAM (SPRAM) with bit-by-bit bidirectional current write and parallelizing-direction current read
    • T. Kawahara, R. Takemura, and K. Miura,"2Mb Spin-Transfer Torque RAM (SPRAM) with Bit-by-Bit Bidirectional Current Write and Parallelizing-Direction Current Read," in IEEE International Solid-State Circuits Conference, 2007, pp. 480-617.
    • (2007) IEEE International Solid-State Circuits Conference , pp. 480-617
    • Kawahara, T.1    Takemura, R.2    Miura, K.3
  • 6
    • 84892545647 scopus 로고    scopus 로고
    • Circuit and microarchitecture evaluation of 3D stacking magnetic RAM (MRAM) as a universal memory replacement
    • D. Xiangyu, W. Xiaoxia, L. Helen,"Circuit and Microarchitecture Evaluation of 3D Stacking Magnetic RAM (MRAM) as a Universal Memory Replacement," in Design Automation Conference, 2009, pp 554-559.
    • (2009) Design Automation Conference , pp. 554-559
    • Xiangyu, D.1    Xiaoxia, W.2    Helen, L.3
  • 7
    • 36049053305 scopus 로고
    • Reversible electrical switching phenomena in disordered structures
    • S. R. Ovshinsky,"Reversible Electrical Switching Phenomena in Disordered Structures," Physical Review Letter, Vol. 21, No. 20, 1968, pp. 1450.
    • (1968) Physical Review Letter , vol.21 , Issue.20 , pp. 1450
    • Ovshinsky, S.R.1
  • 8
    • 0035717521 scopus 로고    scopus 로고
    • OUM-A 180nm nonvolatile memory cell element technology, for stand alone and embedded applications
    • S. Lai and T. Lowrey,"OUM-A 180nm Nonvolatile Memory Cell Element Technology, For Stand Alone and Embedded Applications," IEDM Tech. Dig., 2001, pp. 803.
    • (2001) IEDM Tech. Dig. , pp. 803
    • Lai, S.1    Lowrey, T.2
  • 10
    • 9344233646 scopus 로고    scopus 로고
    • On-chip MRAM as a high-bandwidth low-latency replacement for DRAM physical memories
    • R. Desikan, C. R. Lefurgy, S. W. Keckler, and D. Burger,"On-chip MRAM as a high-bandwidth low-latency replacement for DRAM physical memories," Tech. Rep., 2002.
    • (2002) Tech. Rep.
    • Desikan, R.1    Lefurgy, C.R.2    Keckler, S.W.3    Burger, D.4
  • 11
    • 84866610520 scopus 로고    scopus 로고
    • Assessment of MRAM technology characteristics and architectures
    • R. Desikan, S. Keckler, and D. Burger,"Assessment of MRAM technology characteristics and architectures," Tech. Rep., 2002.
    • (2002) Tech. Rep.
    • Desikan, R.1    Keckler, S.2    Burger, D.3
  • 13
    • 34247381686 scopus 로고    scopus 로고
    • Cache miss behavior: Is it ?2
    • A. Hartstein et al.,"Cache miss behavior: is it ?2," in Proc. Computing frontiers, pp. 313-320, 2006.
    • (2006) Proc. Computing Frontiers , pp. 313-320
    • Hartstein, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.