In situ real-time X-ray diffraction during thin film growth of pentacene

Molecular Crystals and Liquid Crystals

Volumn 566, Issue 1, 2012, Pages 18-21

  Watanabe, T ^a   Hosokai, T ^a   Koganezawa, T ^b   Yoshimoto, N ^a  

^a IWATE UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

2D GIXD; Organic semiconductor; Structural analysis; Thin film growth; X ray diffraction

Indexed keywords

2D-GIXD; BULK PHASE; DEPOSITION CHAMBERS; GRAZING INCIDENCE X-RAY DIFFRACTION; IN-SITU; PENTACENE THIN FILMS; PENTACENES; POLYMORPHIC TRANSFORMATION; REAL-TIME OBSERVATION; REAL-TIME X-RAY DIFFRACTION; ROOM TEMPERATURE; SPRING-8; THIN FILM PHASE;

CRYSTAL GROWTH; FILM GROWTH; SEMICONDUCTING ORGANIC COMPOUNDS; STRUCTURAL ANALYSIS; X RAY DIFFRACTION;

THIN FILMS;

EID: 84866597219     PISSN: 15421406     EISSN: 15635287     Source Type: Journal    
DOI: 10.1080/15421406.2012.701111     Document Type: Conference Paper

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