Double atomic layers of graphene/monolayer h-BN on Ni(111) studied by scanning tunneling microscopy and scanning tunneling spectroscopy

Surface Review and Letters

Volumn 9, Issue 3-4, 2002, Pages 1459-1464

  Kawasaki, Toyosei ^a   Ichimura, Takashi ^a   Kishimoto, Hiroshi ^a   Akbar, Ade Asneil ^a   Ogawa, Takashi ^a   Oshima, Chuhei ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

Graphene; h BN; Ni(111); STM; STS

Indexed keywords

NICKEL;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; COMPLEX FORMATION; ELECTRICITY; ELECTRON DIFFRACTION; ENERGY; FILM; MEASUREMENT; MOLECULAR INTERACTION; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY; SURFACE PROPERTY;

EID: 0036619436     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x02003883     Document Type: Article

References (8)

1. C. Oshima and A. Nagashima, J. Phys. Condens. Matter 9, 1 (1997).
2. E. Rokuta, Y. Hasegawa, K. Suzuki, Y. Gamou, C. Oshima and A. Nagashima, Phys. Rev. Lett. 79, 4609 (1997).
3. H. Bilz and W. Kress, Phonon Dispersion Relations in Insulators (Springer, Berlin, 1979).
4. C. Oshima, A. Itoh, E. Rokuta, T. Tanaka, K. Yamashita and T. Sakurai, Solid State Commun. 116, 37 (2000).
5. A. Nagashima, Y. Gamou, M. Terai, M. Wakabayshi and C. Oshima, Phys. Rev. B56, 13491 (1996).
6. R. J. Simon and M. Trenary, J. Electron Spectrosc. Relat. Phenom. 54&55, 717 (1990).
7. Y. Gamou, M. Terai, A. Nagashima and C. Oshima, Sci, Rep. Res. Inst. Tohoku Univ. A44, 211 (1997).
8. W. Auwarter, T.J. Kreutz, T. Greber and J. Osterwalder, Surf. Sci. 429, 229 (1999).