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Volumn 606, Issue 23-24, 2012, Pages 1771-1776

Extracting the near surface stoichiometry of BiFe 0.5Mn 0.5O 3 thin films; A finite element maximum entropy approach

(9) Song, F a,b Monsen, A a Li, Z S c Choi, E M d MacManus Driscoll, J L d Xiong, J e Jia, Q X e Wahlstrom E a Wells, J W a,f

a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (Norway)

b UNIVERSITY OF GRONINGEN (Netherlands)

c AARHUS UNIVERSITY (Denmark)

d UNIVERSITY OF CAMBRIDGE (United Kingdom)

e LOS ALAMOS NATIONAL LABORATORY (United States)

f LUND UNIVERSITY (Sweden)

Author keywords

BFMO; Depth profiling; Maximum entropy; Metal oxide: synchrotron photoemission; Perovskites; XPS

Indexed keywords

BFMO; BIFE; BULK-LIKE; CHEMICAL COMPOSITIONS; DEPTH DEPENDENCE; DEPTH DEPENDENTS; FINITE ELEMENT; FINITE ELEMENT MODELS; MAXIMUM ENTROPY; NEAR-SURFACE; PEROVSKITE THIN FILMS; PHOTON ENERGY; POTENTIAL APPLICATIONS; SYNCHROTRON PHOTOEMISSION; SYNCHROTRON PHOTOEMISSION SPECTROSCOPY; UNIT CELLS; VALENCIES;

BISMUTH; DEPTH PROFILING; MANGANESE COMPOUNDS; METALLIC COMPOUNDS; PEROVSKITE; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

MANGANESE;

EID: 84866406865 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2012.06.016 Document Type: Article

Times cited : (6)

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