Epitaxial growth and properties of metastable BiMnO 3 thin films

Applied Physics Letters

Volumn 84, Issue 1, 2004, Pages 91-93

  Dos Santos, António F Moreira ^a   Cheetham, Anthony K ^a   Tian, Wei ^b   Pan, Xiaoqing ^b   Jia, Yunfa ^c   Murphy, Nathan J ^c   Lettieri, James ^c   Schlom, Darrell G ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC TRANSITION; NONSTOICHIOMETRY;

ELECTRON DIFFRACTION; EPITAXIAL GROWTH; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); MAGNETIC HYSTERESIS; MAGNETIZATION; SEMICONDUCTING BISMUTH COMPOUNDS; SINGLE CRYSTALS; STOICHIOMETRY; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 0942289169     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1636265     Document Type: Article

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